Refractive index of polyaryletherketone (PEEK) at X- and W-Band /

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Bibliographic Details
Main Authors: Schemmel, Peter J. (Author), Lambert, Kevin M. (Author)
Format: Government Document Electronic eBook
Language:English
Published: Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, October 2019.
Series:NASA technical memorandum ; 2019-220223.
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Online Access:CONNECT