X-ray characterization of materials /
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor fil...
Saved in:
Other Authors: | Lifshin, Eric |
---|---|
Format: | Electronic eBook |
Language: | English |
Published: |
Weinheim ; New York :
Wiley-VCH,
©1999.
|
Subjects: | |
Online Access: | CONNECT |
Similar Items
-
X-rays and materials /
Published: (2012) -
X-ray absorption spectroscopy for the chemical and materials sciences /
by: Evans, John, 1949 June 2-
Published: (2018) -
X-Ray Fluorescence Spectroscopy for Laboratory Applications /
by: Flock, Jorg, et al.
Published: (2021) - X-ray spectrometry : XRS.
-
X-Ray Spectrometry: Recent Technological Advances /
by: Tsuji, Kouichi
Published: (2004)