X-ray characterization of materials /
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor fil...
Saved in:
Other Authors: | |
---|---|
Format: | Electronic eBook |
Language: | English |
Published: |
Weinheim ; New York :
Wiley-VCH,
©1999.
|
Subjects: | |
Online Access: | CONNECT |