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|a C 13.46:472
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|a Online Government Document
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1 |
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|a Bullis, W. Murray.
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| 245 |
1 |
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|a Methods of measurement for semiconductor materials, process control, and devices. /
|c W. Murray Bullis.
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| 264 |
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1 |
|a Gaithersburg, MD :
|b U.S. Dept. of Commerce, National Institute of Standards and Technology,
|c 1968.
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|a NBS technical note ;
|v 472
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|a 1968.
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|a Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
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|a Title from PDF title page.
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|a Includes bibliographical references.
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|a Bullis, W. Murray.
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|a United States.
|b National Bureau of Standards.
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|a NBS technical note ;
|v 472.
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