Small aperture analysis of the dual TEM cell and an investigation of test object scattering in a single TEM cell /
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| Main Author: | |
|---|---|
| Corporate Author: | |
| Format: | Government Document Electronic eBook |
| Language: | English |
| Published: |
Gaithersburg, MD :
U.S. Dept. of Commerce, National Institute of Standards and Technology,
1984.
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| Series: | NBS technical note ;
1076. |
| Subjects: | |
| Online Access: | CONNECT |
