Measurement techniques for high power semiconductor materials and devices : annual report, January 1 to December 31, 1976 /

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Bibliographic Details
Main Author: Blackburn, D. L.
Corporate Author: United States. National Bureau of Standards
Other Authors: Koyama, R. Y., Oattinger, F. F., Rogers, G. J.
Format: Government Document Electronic eBook
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1977.
Series:NBSIR ; 77-1249.
Online Access:CONNECT

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