Microwave photoelasticity : exploiting multiple resonances to measure stress changes within yttria-partially-stabilized /

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Bibliographic Details
Main Authors: Waldstein, Seth W. (Author), Schemmel, Peter J. (Author)
Format: Government Document Electronic eBook
Language:English
Published: Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, October 2021.
Series:NASA technical memorandum ; 20210018297.
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Online Access:CONNECT