Low voltage electron microscopy : principles and applications /
"Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for curre...
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Other Authors: | , |
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Format: | Electronic eBook |
Language: | English |
Published: |
Chichester, West Sussex :
John Wiley & Sons Inc. in association with the Royal Microscopical Society,
2013.
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Series: | RMS-Wiley series.
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Subjects: | |
Online Access: | CONNECT |
MARC
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245 | 0 | 0 | |a Low voltage electron microscopy : |b principles and applications / |c edited by David C. Bell, Natasha Erdman. |
260 | |a Chichester, West Sussex : |b John Wiley & Sons Inc. in association with the Royal Microscopical Society, |c 2013. | ||
300 | |a 1 online resource (xiii, 203 pages, 14 unnumbered pages of plates) : |b illustrations (some color) | ||
336 | |a text |b txt |2 rdacontent | ||
337 | |a computer |b c |2 rdamedia | ||
338 | |a online resource |b cr |2 rdacarrier | ||
504 | |a Includes bibliographical references and index. | ||
520 | |a "Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before"-- |c Provided by publisher. | ||
520 | |a "The book describes the recent advances in the area of low-voltage electron microscopy, covering topics in TEM, SEM, STEM"-- |c Provided by publisher. | ||
588 | 0 | |a Print version record. | |
505 | 0 | |a Introduction to the Theory and Advantages of Low Voltage Electron Microscopy / David C Bell, Natasha Erdman -- SEM Instrumentation Developments for Low kV Imaging and Microanalysis / Natasha Erdman, David C Bell -- Extreme High-Resolution (XHR) SEM Using a Beam Monochromator / Richard J Young, Gerard N A van Veen, Alexander Henstra, Lubomir Tuma -- The Application of Low-Voltage SEM : From Nanotechnology to Biological Research / Natasha Erdman, David C Bell -- Low Voltage High-Resolution Transmission Electron Microscopy / David C Bell -- Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits / Ondrej L Krivanek, Wu Zhou, Matthew F Chisholm, Juan Carlos Idrobo, Tracy C Lovejoy, Quentin M Ramasse, Niklas Dellby -- Low Voltage Scanning Transmission Electron Microscopy of Oxide Interfaces / Robert Klie -- What's Next? The Future Directions in Low Voltage Electron Microscopy / David C Bell, Natasha Erdman. | |
590 | |a O'Reilly Online Learning Platform: Academic Edition (SAML SSO Access) | ||
650 | 0 | |a Electron microscopy |x Technique. | |
700 | 1 | |a Bell, D. C. |q (David C.) | |
700 | 1 | |a Erdman, Natasha. | |
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776 | 0 | 8 | |i Print version: |t Low voltage electron microscopy. |d Chichester, West Sussex : John Wiley & Sons Inc. in association with the Royal Microscopical Society, 2013 |z 9781119971115 |w (DLC) 2012033919 |w (OCoLC)814389516 |
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